发明名称 Method and apparatus for improving temperature performance for GaAsSb/GaAs devices
摘要 A method and apparatus is provided for improving the temperature performance of GaAsSb materials utilizing an AlGaInP confinement structure. An active region containing a GaAsSb quantum well layer and (In)GaAs barrier layers is sandwiched between two AlGaInP confinement layers. AlGaInP confinement structures provide sufficient electron confinement, thereby improving the stability of the threshold current with respect to increasing temperature for GaAsSb/GaAs heterostructures.
申请公布号 US6931044(B2) 申请公布日期 2005.08.16
申请号 US20030368274 申请日期 2003.02.18
申请人 AGILENT TECHNOLOGIES, INC. 发明人 BOUR DAVID P.;TAN MICHAEL R. T.;CHANG YING-LAN
分类号 H01S5/20;H01L33/06;H01S5/00;H01S5/183;H01S5/323;H01S5/34;H01S5/343;(IPC1-7):H01S5/00 主分类号 H01S5/20
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