发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR THIN FILM AND IMAGE DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a high quality and homogeneous semiconductor thin film for reducing the roughness of a film and crystal defect in a film to be generated in the process of crystallization. SOLUTION: This method for manufacturing a semiconductor thin film is provided to carry out laser irradiation of the arbitrary region of a semiconductor thin film formed on a substrate by scanning a laser beam or the substrate to form an almost band-shaped crystal crystallized so that crystal particles can be grown in the scanning direction. On X/Y coordinates where the value x of the beam diameter W(μm) of the laser beam measured in a direction which is almost the same as the scanning direction is defined as an X axis, and the value y of a scanning speed Vs(m/s) is defined as a Y axis, the crystallization processing is carried out in the region where the beam diameter W is larger than the wavelength of the laser beam (condition 1), the scanning speed Vs is smaller than the upper limit of the crystal growing speed (condition 2), and x×(1/y)<25μs are all satisfied (condition 3). COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005217214(A) 申请公布日期 2005.08.11
申请号 JP20040022473 申请日期 2004.01.30
申请人 HITACHI LTD;HITACHI DISPLAYS LTD 发明人 HATANO MUTSUKO;HONGO MIKIO;YAZAKI AKIO;TAI MITSUHARU;NODA TAKASHI;TAKASAKI YUKIO
分类号 G02F1/1368;C30B1/06;G02F1/133;H01L21/20;H01L21/268;H01L21/324;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L21/268;G02F1/136 主分类号 G02F1/1368
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