发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR THIN FILM AND IMAGE DISPLAY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a high quality and homogeneous semiconductor thin film for reducing the roughness of a film and crystal defect in a film to be generated in the process of crystallization. SOLUTION: This method for manufacturing a semiconductor thin film is provided to carry out laser irradiation of the arbitrary region of a semiconductor thin film formed on a substrate by scanning a laser beam or the substrate to form an almost band-shaped crystal crystallized so that crystal particles can be grown in the scanning direction. On X/Y coordinates where the value x of the beam diameter W(μm) of the laser beam measured in a direction which is almost the same as the scanning direction is defined as an X axis, and the value y of a scanning speed Vs(m/s) is defined as a Y axis, the crystallization processing is carried out in the region where the beam diameter W is larger than the wavelength of the laser beam (condition 1), the scanning speed Vs is smaller than the upper limit of the crystal growing speed (condition 2), and x×(1/y)<25μs are all satisfied (condition 3). COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005217214(A) |
申请公布日期 |
2005.08.11 |
申请号 |
JP20040022473 |
申请日期 |
2004.01.30 |
申请人 |
HITACHI LTD;HITACHI DISPLAYS LTD |
发明人 |
HATANO MUTSUKO;HONGO MIKIO;YAZAKI AKIO;TAI MITSUHARU;NODA TAKASHI;TAKASAKI YUKIO |
分类号 |
G02F1/1368;C30B1/06;G02F1/133;H01L21/20;H01L21/268;H01L21/324;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/786;(IPC1-7):H01L21/268;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|