发明名称 |
SYSTEM AND METHOD FOR TESTING OF DISPLAY PANEL |
摘要 |
PROBLEM TO BE SOLVED: To provide a system and a method for testing of a display panel which accurately can detect failure of the display panel itself. SOLUTION: This testing method comprises a step to irradiate light on surface of the display panel and photograph the above display panel for obtaining the first image, a step to irradiate light on surface of the above display panel with pattern impressed on the display panel for obtaining the second image, and a step to compare the first image with the second image for determining whether the display panel is defective. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005214962(A) |
申请公布日期 |
2005.08.11 |
申请号 |
JP20040312970 |
申请日期 |
2004.10.27 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
CHO SUE JIN;YOU HYUNG SUN;LEE JANG HEE |
分类号 |
G01N21/88;G01M11/00;G01N21/95;G01N21/956;G02F1/13;G09F9/00;(IPC1-7):G01M11/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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