发明名称 FINE-PARTICULATE ANALYZER
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a fine-particulate analyzer capable of measuring a particle size distribution of fine particulates having a wide distribution from a nano-meter size to a submicron size suspended in a gas phase, and the change along with a lapse of time in a number concentration about the specified particle size of fine particulate while classifying in two kinds of particle size ranges, at the same time and in a real time. <P>SOLUTION: In this fine-particulate analyzer, the first measuring area 2 is formed between a common electrode part 4 and the center electrode 5, in a differential type electric mobility measuring instrument 1, the second measuring area 3 is formed between the common electrode part 4 and a conductive sleeve 20, the charged fine particulates are led into a sample gas introducing hole 27 through a sample gas introducing tube 26, one portion thereof is taken in the first measuring area 2 via a sample gas introducing slit 10, the remainder thereof is taken in the second measuring area 3 from a sample gas introducing flow passage 31, and the taken-in charged particulates are classified under respective measuring conditions. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005214931(A) 申请公布日期 2005.08.11
申请号 JP20040025586 申请日期 2004.02.02
申请人 WYCKOFF KAGAKU KK 发明人 TAKEUCHI KAZUO;OKADA YOSHIKI;YABUGEN JIYUNSUKE
分类号 G01N27/60;B03C7/02;G01N15/02;(IPC1-7):G01N15/02 主分类号 G01N27/60
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