发明名称 Method for manufacturing semiconductor device
摘要 A manufacturing method is for providing an excellent wire bonding property in the manufacturing of a semiconductor device using an organic resin wiring substrate. In the manufacturing of the semiconductor device, a thermosonic wire bonding apparatus is used when the electrodes of a semiconductor element fixed to the principal surface of a substrate are connected to lines on the substrate with wires. To connect the first and second portions to be bonded of the substrate placed on a wire bonding stage with wires each held by a capillary, the wire bonding apparatus heats the capillary to a specified temperature by irradiating the capillary with a laser beam for a given period of time immediately before first bonding for connecting the wire to the first portion to be bonded and immediately before second bonding for connecting the wire to the second portion to be bonded and heats the portions of the wires to be bonded with the resulting heat, thereby connecting the wires to predetermined portions by using thermocompression and ultrasonic vibration.
申请公布号 US2005176178(A1) 申请公布日期 2005.08.11
申请号 US20040516257 申请日期 2004.11.30
申请人 TAKAHASHI TOMISHI 发明人 TAKAHASHI TOMISHI
分类号 H01L21/60;H01L21/48;H01L21/56;H01L21/607;H01L21/68;H01L23/31;(IPC1-7):H01L21/44 主分类号 H01L21/60
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