发明名称 Temperature control method and apparatus and exposure method and apparatus
摘要 A temperature control technique and an exposure technique are provided with which high temperature control accuracy can be realized even when a device, which causes thermal fluctuation depending on a temperature-controlled fluid, is used. A gas recovered from a reticle chamber as the temperature control objective, and a high purity purge gas supplied from a gas supply source are mixed in a mixing section. The temperature of the mixed gas is lowered by a refrigerator. Subsequently, the humidity of the gas is measured by a temperature sensor. The gas is then supplied to the reticle chamber via a heating mechanism, a chemical filter which absorbs or generates heat depending on the humidity and a dust protective filter. The heating amount to the gas by the heating mechanism is controlled based on temperature information by a temperature sensor in the reticle chamber and humidity information by the humidity sensor.
申请公布号 US2005175497(A1) 申请公布日期 2005.08.11
申请号 US20050066008 申请日期 2005.02.25
申请人 NIKON CORPORATION 发明人 ARAI DAI;YOSHIDA TOMOYUKI
分类号 G03F7/20;(IPC1-7):G05B19/43 主分类号 G03F7/20
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