发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that can be downsized while maintaining a high breakdown voltage. SOLUTION: An intermediate potential electrode 20 formed to surround an IGBT cell is provided between field plates 14 and 15 on a field oxide film 13 at the outer circumferential part of an IGBT chip. An intermediate potential application means locally formed to part of the region on the chip outer circumferential part gives a prescribed level, which is a level between the level of an emitter electrode 10 and the level of a channel stopper electrode 12 to the intermediate potential electrode 20. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005217152(A) 申请公布日期 2005.08.11
申请号 JP20040021476 申请日期 2004.01.29
申请人 MITSUBISHI ELECTRIC CORP 发明人 TAKAHASHI TETSUO
分类号 H01L21/328;H01L21/331;H01L29/06;H01L29/40;H01L29/739;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/328
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