发明名称 INSPECTION SYSTEM FOR SYSTEM LSI
摘要 <P>PROBLEM TO BE SOLVED: To properly inspect a high-speed operation part in a system LSI. <P>SOLUTION: In this system, a multiplying rate of the second PLL 123 for generating a clock signal to the high-speed operation part is changed to make an operation frequency for the high-speed operation part such as a CPU 60, a high-speed bus 70 and an SDRAM 140 in a inspection processing time get higher than that in a usual operation time. A trouble detected only under the condition where the operation frequency is heightened is surely detected by this manner. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005214939(A) 申请公布日期 2005.08.11
申请号 JP20040025862 申请日期 2004.02.02
申请人 DENSO CORP 发明人 SASAKI TOSHIYUKI
分类号 G01R31/3183;G01R31/28;G06F11/22;H01L21/822;H01L27/04 主分类号 G01R31/3183
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