发明名称 OXIDATION SILICON DEPOSITING METHOD, EQUIPMENT, STI, MANUFACTURED BY THE METHOD AND THE EQUIPMENT, AND INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide an STI which is great in aspect ratio and formed of a high quality SiO<SB>2</SB>film. SOLUTION: This method comprises processes of introducing an oxygen gas and a chlorine gas 18 into an evacuated chamber 1; generating gas plasma 14 by supplying electric power to a plasma antenna 27 simultaneously; mainly generating a precursor 15 by etching an etched component 20 made of silicon with a chlorine gas radical after that; adsorbing the precursor 15 to a substrate 3 by the adjustment of a temperature control means 6; and embedding the SiO<SB>2</SB>film in a pattern for separation which is high in aspect ratio in such a way that the precursor 15 adsorbed to the substrate is reduced by the chlorine gas radical, and that the precursor is reacted to form the SiO<SB>2</SB>film by being oxidized with the oxidation gas radical simultaneously after that. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005217339(A) 申请公布日期 2005.08.11
申请号 JP20040025125 申请日期 2004.02.02
申请人 MITSUBISHI HEAVY IND LTD;RENESAS TECHNOLOGY CORP 发明人 SAKAMOTO HITOSHI
分类号 H01L21/76;H01L21/31;H01L21/316;(IPC1-7):H01L21/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址