发明名称 |
OXIDATION SILICON DEPOSITING METHOD, EQUIPMENT, STI, MANUFACTURED BY THE METHOD AND THE EQUIPMENT, AND INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To provide an STI which is great in aspect ratio and formed of a high quality SiO<SB>2</SB>film. SOLUTION: This method comprises processes of introducing an oxygen gas and a chlorine gas 18 into an evacuated chamber 1; generating gas plasma 14 by supplying electric power to a plasma antenna 27 simultaneously; mainly generating a precursor 15 by etching an etched component 20 made of silicon with a chlorine gas radical after that; adsorbing the precursor 15 to a substrate 3 by the adjustment of a temperature control means 6; and embedding the SiO<SB>2</SB>film in a pattern for separation which is high in aspect ratio in such a way that the precursor 15 adsorbed to the substrate is reduced by the chlorine gas radical, and that the precursor is reacted to form the SiO<SB>2</SB>film by being oxidized with the oxidation gas radical simultaneously after that. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005217339(A) |
申请公布日期 |
2005.08.11 |
申请号 |
JP20040025125 |
申请日期 |
2004.02.02 |
申请人 |
MITSUBISHI HEAVY IND LTD;RENESAS TECHNOLOGY CORP |
发明人 |
SAKAMOTO HITOSHI |
分类号 |
H01L21/76;H01L21/31;H01L21/316;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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