Electronic component test apparatus

摘要

A test apparatus (11) and method in which a compressible housing (17) is used to retain an electronic component (14) having conductors (13) thereon. The compressible housing (17) is lowered onto a suitable base member (15) having upstanding probes (19) which are also compressible and which physically engage respective ones of the conductors (13) at one end thereof and an appropriate conductor (e.g., conductive pads on a printed circuit board) on the other when the test apparatus (11) is fully assembled and testing occurs.