发明名称 PROBE FOR PHYSICAL PROPERTIES MEASUREMENT
摘要 <p>The present invention relates to a probe (31) used in a physical property measuring apparatus that measures a complex dielectric constant of a measured object to measure a physical property value of the measured object on the basis of the measured complex dielectric constant, the physical property value being represented by the water content, the probe having an internal electrode (311) and an external electrode (312). An end surface (313) is formed obliquely to an axial direction of the internal electrode (311) in order to accurately measure the complex dielectric constant regardless of whether or not the surface of the measured object has roughness and to set an appropriate electric length. &lt;IMAGE&gt;</p>
申请公布号 EP1562039(A1) 申请公布日期 2005.08.10
申请号 EP20030758935 申请日期 2003.10.27
申请人 NICHIREI CORPORATION;TOKAI UNIVERSITY 发明人 INOUE, TOSHIFUMI;YAGIHARA, SHIN;SHINYASHIKI, NAOKI
分类号 G01N22/00;G01N22/04;G01N33/02;(IPC1-7):G01N22/00 主分类号 G01N22/00
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