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发明名称
TEST CIRCUIT
摘要
申请公布号
KR20050079536(A)
申请公布日期
2005.08.10
申请号
KR20040008024
申请日期
2004.02.06
申请人
HYNIX SEMICONDUCTOR INC.
发明人
KIM, DUCK JU
分类号
G11C29/00;(IPC1-7):G11C29/00
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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