发明名称 Method and circuit for testing a regulated power supply in an integrated circuit
摘要 A voltage regulated power supply test circuit including: a voltage regulator electrically connected to at least one regulated voltage node of a functional circuit of an integrated circuit chip; and means for selectively connecting between one of the at least one regulated voltage nodes and ground with at least one load circuit adapted to put an emulated current load of the functional circuit on the regulated voltage supply.
申请公布号 US6927590(B2) 申请公布日期 2005.08.09
申请号 US20030604844 申请日期 2003.08.21
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 IADANZA JOSEPH A.
分类号 G01R31/28;G01R31/317;G01R31/40;H01L21/822;H01L27/04;(IPC1-7):G01R31/02 主分类号 G01R31/28
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