Devices and methods for detecting the position of a beam

摘要

A device is proposed for the precision rotation of samples on a diffractometer, especially for X-ray or synchrotron radiation diffraction experiments, comprising: a centering element ( 26 ) which is held at one end of a motor-driven rotating shaft ( 22 ) and can be displaced in a plane orthogonal to the axis of rotation of the rotating shaft ( 22 ), a sample holder ( 30 ) which is fixed to the centering element ( 26 ) or integral with the latter for holding a sample ( 32 ) substantially centrally with respect to the axis of rotation in an X-ray or synchrotron radiation beam (S), at least one micrometer finger ( 36 ) which is arranged in the region of the centering element ( 26 ) and can be positioned orthogonally with respect to the axis of rotation of the rotating shaft ( 22 ) by means of a micrometer finger drive device.