发明名称 |
Built in self test method and circuit for parallel optical transmitters |
摘要 |
An on-chip parallel data generator, including a Built In Self Test (BIST) generator, is integrated into a laser driver array of a parallel optical communication transmitter so that all optical outputs switch simultaneously. The BIST generator requires only one clock input which clocks the BIST generator for all channels. The optical outputs respond to either the on-chip BIST generator or the electrical inputs if a valid signal is present on the inputs.
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申请公布号 |
US6928242(B1) |
申请公布日期 |
2005.08.09 |
申请号 |
US20000689758 |
申请日期 |
2000.10.13 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DEMSKY KEVIN PAUL;FREITAG LADD WILLIAM;PASCHAL MATTHEW JAMES |
分类号 |
H04B10/08;H04B10/155;(IPC1-7):H04B10/08 |
主分类号 |
H04B10/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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