发明名称 Guided self-assembly of block copolymer films on interferometrically nanopatterned substrates
摘要 Copolymer structures are formed by exposing a substrate with an imaging layer thereon to two or more beams of selected wavelengths to form interference patterns at the imaging layer to change the wettability of the imaging layer in accordance with the interference patterns. A layer of a selected block copolymer is deposited onto the exposed imaging layer and annealed to separate the components of the copolymer in accordance with the pattern of wettability and to replicate the pattern of the imaging layer in the copolymer layer. Stripes or isolated regions of the separated components may be formed with periodic dimensions in the range of 100 nm or less.
申请公布号 US6926953(B2) 申请公布日期 2005.08.09
申请号 US20040800923 申请日期 2004.03.15
申请人 WISCONSIN ALUMNI RESEARCH FOUNDATION 发明人 NEALEY PAUL F.;DEPABLO JUAN J.;CERRINA FRANCESCO;SOLAK HARUN H.;YANG XIAOMIN;PETERS RICHARD D.;WANG QIANG
分类号 G03F7/00;G03F7/16;G03F7/26;G03F7/38;(IPC1-7):B32B31/04 主分类号 G03F7/00
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