| 发明名称 |
METHOD FOR PRECISELY DETECTING A DEFECT SECTOR, ESPECIALLY CONCERNED WITH ENABLING A USER TO PRECISELY DETECTING THE DEFECT SECTOR BY CONTROLLING AN ACTIVATED POINT OF A READ GATE SIGNAL |
| 摘要 |
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| 申请公布号 |
KR100508721(B1) |
申请公布日期 |
2005.08.08 |
| 申请号 |
KR19980001119 |
申请日期 |
1998.01.16 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, GYU TAEK |
| 分类号 |
G11B20/18;(IPC1-7):G11B20/18 |
主分类号 |
G11B20/18 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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