发明名称 Integrated circuit test mode securisation method by intrusion detection
摘要 The circuit has configurable cells (2a, 2w, 2z) with multiplexers and flip-flops and adopting operating and test modes based on control signals on control conductors. A spy circuit delivers an output signal adopting states representing no fault/attempted intrusion, based on whether a logic combination of signals passing through the conductors relates to a combination of control signals visible in an operating state.
申请公布号 EP1560032(A1) 申请公布日期 2005.08.03
申请号 EP20050290173 申请日期 2005.01.26
申请人 STMICROELECTRONICS S.A. 发明人 BANCEL, FREDERIC;HELY, DAVID
分类号 G01R31/317;G01R31/3185;G06F12/14;G06F21/00 主分类号 G01R31/317
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