Method and apparatus for film thickness measurement

摘要

The thickness of a thin film (14) can be measured based on the X-ray diffraction method. An X-ray (16) is allowed to be incident upon a surface of the thin film (14). An intensity of a diffracted X-ray (20) is measured with the incident angle ± being changed to obtain a measured rocking curve. On the other hand, a theoretical rocking curve is calculated in consideration of an orientation density distribution function Á of the thin film (14). A scale factor is predetermined for a standard sample having a known film thickness. A parameter fitting operation is carried out in a manner that the characteristic parameter of the function Á and the film thickness t are adjusted so that the theoretical rocking curve including the scale factor can approach the measured rocking curve as closely as possible.