| 摘要 |
A system-in-package (SiP) type semiconductor device has a test function capable of conducting a test singly on a memory chip directly from outside. When a mode signal included in a test signal input from an external connection terminal indicates a "normal operation mode", a test circuit provided on a logic chip allows a logic circuit to use an access path (wiring) to a memory circuit. On the other hand, when the mode signal indicates a "test mode", the test circuit uses the access path to access the memory circuit and conducts a test, an accelerated life test, or a multi-bit test, based on the content of the test signal input from the external connection terminal. The test circuit also conducts a built-in self-test. |
