| 摘要 |
A method for testing a core power distribution system for an integrated circuit chip which includes arranging a plurality of experiments for an integrated circuit chip, performing the plurality of experiments for the integrated circuit chip over a range of frequencies over a range of power distribution system impedances, generating a schmoo diagram for each of the plurality of experiments, and analyzing the schmoo diagrams to determine whether the core power distribution system functions is acceptable at a particular frequency.
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