发明名称 Method of making a semiconductor device with dummy diffused layers
摘要 A semiconductor device, including a dummy diffused layer in the upper part of a substrate, has its noise immunity improved. The dummy diffused layer is formed between analog and digital blocks to eliminate dishing, which usually occurs during a CMP process for defining STI regions. The surface of the dummy diffused layer is covered with an anti-silicidation film at least partially and a dummy gate electrode so as not to be silicided. The dummy gate electrode can be formed along with a normal gate electrode for a transistor.
申请公布号 US6924187(B2) 申请公布日期 2005.08.02
申请号 US20030460172 申请日期 2003.06.13
申请人 MATSUSHITA ELECTRICAL INDUSTRIAL CO., LTD. 发明人 ISHIKURA SATOSHI;IIJIMA YUKIO;MINAKUCHI NOBUAKI
分类号 H01L21/76;H01L21/761;H01L21/762;H01L21/822;H01L21/8238;H01L27/04;H01L27/08;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L21/76
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