发明名称 Semiconductor device
摘要 A p well serving as a channel region of a MOSFET is formed on one side of an n<SUP>-</SUP> layer and an n<SUP>+</SUP> drain region is formed on the other side. Above the n<SUP>-</SUP> layer, a plurality of first floating field plates are formed with a first insulating film interposed therebetween. A plurality of second floating field plates are formed thereon with a second insulating film interposed therebetween. Assuming that the thickness of the first insulating film is "a" and the distance between the first floating field plates and the second floating field plates in a direction of thickness of the second insulating film is "b", a relation a>b is held.
申请公布号 US2005161761(A1) 申请公布日期 2005.07.28
申请号 US20040998983 申请日期 2004.11.30
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HATADE KAZUNARI
分类号 H01L29/06;H01L21/335;H01L27/088;H01L27/12;H01L29/08;H01L29/40;H01L29/423;H01L29/739;H01L29/78;H01L29/861;(IPC1-7):H01L27/12 主分类号 H01L29/06
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