| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce occurrence of damage to an organic EL panel accompanying the application of a test driving signal in the test of the organic EL panel. <P>SOLUTION: This is the test device with which respective pixels in the organic EL panel are tested from the electric signals obtained by driving the organic EL panel, and it is constituted so that a drive monitoring part 4 to monitor the test driving signals applied to the organic EL panel is provided. A drive circuit 3 is to monitor the sequence of the test drive signals applied to the organic EL panel 2. When the drive circuit 3 starts applying the test driving signal to the organic EL panel 2, it monitors if a clock signal applied to the organic El panel 2, a power source voltage for output, and cathode voltage of the organic EL element are applied by sequence of this order. On the contrary, when terminating the application of the test driving signals, it monitors if the clock signal, the power source voltage for the output, and the cathode voltage of the organic EL element are applied by sequence of the inverse order. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
