发明名称 METHOD OF FORMING A BOND PAD
摘要 A top-most layer (64) is formed over a bond pad layer (62) and under a passivation layer (68) and a polyimide layer (72). Openings (70 and 74) are formed within the passivation layer (68) and the polyimide layer (72) to expose the top-most layer (64), which protects the bond pad layer (62) during the formation of the openings (70 and 74). In one embodiment, the exposed top-most layer (64) is selectively etched using hydrogen peroxide and an amine, such as ammonium hydroxide. Because the chemistry does not attack the bond pad layer (62), the bond pad layer's thickness is not decreased and thus, reliability of the bond pad is maintained.
申请公布号 WO2005024902(A3) 申请公布日期 2005.07.28
申请号 WO2004US22894 申请日期 2004.07.16
申请人 FREESCALE SEMICONDUCTOR, INC.;ROCHE, THOMAS, S.;ASCHIERI, PAULE, C. 发明人 ROCHE, THOMAS, S.;ASCHIERI, PAULE, C.
分类号 H01L21/311;H01L21/3213;H01L23/485 主分类号 H01L21/311
代理机构 代理人
主权项
地址