发明名称 |
Single-Pass Methods for Generating Test Patterns for Sequential Circuits |
摘要 |
A single-pass method for generating test patterns for sequential circuits operates upon an iterative array of time-frames representing the circuit. A mapping function is inserted at the end of each time-frame. Fault objects arriving at circuit next-state lines are mapped into good next-state fault objects and are placed onto corresponding present-state lines for a next time-frame. The good next-state mapping permits fault-propagation and path-enabling function size to be bounded by a size established during an initial time-frame. Path-enabling functions created during the initial time-frame are saved and are reused during subsequent time-frames. A search for test patterns continues from one time-frame to a next until a valid test pattern is found for each detectable fault.
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申请公布号 |
US2005166114(A1) |
申请公布日期 |
2005.07.28 |
申请号 |
US20050908146 |
申请日期 |
2005.04.28 |
申请人 |
YARDSTICK RESEARCH, LLC |
发明人 |
BUCKLEY DELMAS R.JR. |
分类号 |
G01R31/28;G01R31/3183;G06F11/00;(IPC1-7):G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
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