| 摘要 |
This invention is about a microscopic technology for improving depth of field and resolution by obverse and opposite scanning and 3 D image combination. According to the above-mentioned design, the thickness of the three-dimensional image can be increased, and the image resolution and the depth of field can be improved. After fixing a sample in 3 D space with embedding gel, the obverse and opposite scanning are performed to the sample, and the images obtained from the mentioned scanning are combined to achieve the 3 D microscopic image with the deeper depth of field. The mentioned 3 D image combination comprises the application of fast Fourier Transferring, Sobel edge checking, and relative matching to determine the overlapping position of the obverse and the opposite scanning images on Z axial. After finding out the shift on X Y plane and the rotation pivoted with Z axial by fast Fourier Transferring theory, the upper and the lower images are adjusted, and a complete 3 D image is achieved.
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