发明名称 FULL AUTOMATIC FINE PARTICLE HEIGHT MEASURING SYSTEM
摘要 PROBLEM TO BE SOLVED: To improve a measuring system of a fine particle height, in a conventional method, the fine particle (9) has to be measured one by one, and it needs a time and a man-hour because one fine particle (9) is placed manually with a precision within a range which is possible taking a photograph of it by a microscope camera or the like. SOLUTION: This invention makes it possible to measure automatically each height of a plurality of the fine particles (9) by a combination of a control of the microscope camera (4) with a personal computer (8) and an imaging processing technology. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005201878(A) 申请公布日期 2005.07.28
申请号 JP20040037485 申请日期 2004.01.13
申请人 KITAYAMA MASABUMI 发明人 KITAYAMA MASABUMI
分类号 G01B11/02;(IPC1-7):G01B11/02 主分类号 G01B11/02
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