发明名称 Production process for a trench transistor uses high energy implant to form a drain drift region into which the base of the trench extends
摘要 <p>A production process for a trench transistor comprises forming an epilayer (11), trench (14), gate dielectric (15) and gate electrode (16) with the transistor in an n-substrate (10) and with a p-body region (20) by the trench and an n-source (13). An n-drift drain (12) is formed by high-energy implant and the base of the trench projects into this region. An independent claim is also included for a trench transistor formed as above.</p>
申请公布号 DE10361135(A1) 申请公布日期 2005.07.28
申请号 DE2003161135 申请日期 2003.12.23
申请人 INFINEON TECHNOLOGIES AG 发明人 HIRLER, FRANZ;PFIRSCH, FRANK
分类号 H01L21/265;H01L21/336;H01L29/08;(IPC1-7):H01L21/336;H01L29/78 主分类号 H01L21/265
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