发明名称 |
Production process for a trench transistor uses high energy implant to form a drain drift region into which the base of the trench extends |
摘要 |
<p>A production process for a trench transistor comprises forming an epilayer (11), trench (14), gate dielectric (15) and gate electrode (16) with the transistor in an n-substrate (10) and with a p-body region (20) by the trench and an n-source (13). An n-drift drain (12) is formed by high-energy implant and the base of the trench projects into this region. An independent claim is also included for a trench transistor formed as above.</p> |
申请公布号 |
DE10361135(A1) |
申请公布日期 |
2005.07.28 |
申请号 |
DE2003161135 |
申请日期 |
2003.12.23 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
HIRLER, FRANZ;PFIRSCH, FRANK |
分类号 |
H01L21/265;H01L21/336;H01L29/08;(IPC1-7):H01L21/336;H01L29/78 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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