发明名称 PLASMA DISPLAY PANEL LIGHTING INSPECTING METHOD
摘要 A method of inspecting lighting of a plasma display panel in which cells are formed at two-level crossings between electrodes arranged in the row direction and electrodes arranged in the column direction and gradation display is conducted by combining subfields constituting one field for lighting. In a predetermined subfield, not applying a write pulse voltage to a cell to be inspected a write pulse voltage is applied to at least one specific cell which is one of the cells adjacent to the cell to be inspected, and in the next subfield a write pulse voltage is applied to the cell to be inspected. If there is a defect in the partition of the cell to be inspected, the discharge in the adjacent cells adversely influences through the defective partition the amount of charge of the partition of the cell to be inspected. As a result, in the next subfield, the cell to be inspected does not light. Thus lighting failure caused by the defective partition can be detection.
申请公布号 WO2005052975(A8) 申请公布日期 2005.07.28
申请号 WO2004JP17668 申请日期 2004.11.22
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;IKURA, TSUNEO;WAKITANI, TAKAO 发明人 IKURA, TSUNEO;WAKITANI, TAKAO
分类号 H01J9/42;H01J11/20;H01J11/44;(IPC1-7):H01J9/42 主分类号 H01J9/42
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