发明名称 |
IMPROVED METHOD FOR PROGRAMMING ELECTRON ON FLOATING GATE OF NONVOLATILE MEMORY CELL |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for improving the programming efficiency of a nonvolatile memory cell which has a floating gate for storing electrons. SOLUTION: The method for programming the cell includes a step for forming an inversion layer in a second part of a channel. An electron flow is generated in a drain region which adjoins the inversion layer, and the electron flow reaches a pinch-off point passing through the inversion layer. The electrons are accelerated through a depletion layer by a magnetic line of force from the floating gate with little dispersion or without the dispersion. Thereby, the electrons are accelerated through an insulator making the floating gate separate from a substrate, and the electrons are injected into the floating gate. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005203801(A) |
申请公布日期 |
2005.07.28 |
申请号 |
JP20050033614 |
申请日期 |
2005.01.13 |
申请人 |
SILICON STORAGE TECHNOLOGY INC |
发明人 |
YEH BING;KIANIAN SOHRAB;HU YAW WEN |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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地址 |
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