发明名称 |
Siloxane-based Resin containing Germanium and Method of Semiconductor Interlayer Insulating Film Using the Same |
摘要 |
<p>Disclosed herein are a siloxane-based resin having germanium and an interlayer insulating film for a semiconductor device formed using the same. The siloxane-based resins have so low dielectric constant in addition to excellent mechanical properties that they are useful materials for an insulating film between interconnect layers of a semiconductor device.</p> |
申请公布号 |
KR100504291(B1) |
申请公布日期 |
2005.07.27 |
申请号 |
KR20030047731 |
申请日期 |
2003.07.14 |
申请人 |
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发明人 |
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分类号 |
C08G77/398;H01L21/31;C08G77/50;C08G77/58;C09D183/14;H01L21/312;H01L23/532;(IPC1-7):H01L21/31 |
主分类号 |
C08G77/398 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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