发明名称 Siloxane-based Resin containing Germanium and Method of Semiconductor Interlayer Insulating Film Using the Same
摘要 <p>Disclosed herein are a siloxane-based resin having germanium and an interlayer insulating film for a semiconductor device formed using the same. The siloxane-based resins have so low dielectric constant in addition to excellent mechanical properties that they are useful materials for an insulating film between interconnect layers of a semiconductor device.</p>
申请公布号 KR100504291(B1) 申请公布日期 2005.07.27
申请号 KR20030047731 申请日期 2003.07.14
申请人 发明人
分类号 C08G77/398;H01L21/31;C08G77/50;C08G77/58;C09D183/14;H01L21/312;H01L23/532;(IPC1-7):H01L21/31 主分类号 C08G77/398
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