发明名称 HEAT TREATING SYSTEM AND HEAT TREATING METHOD
摘要 A thermal processing unit of the present invention includes: a holder that holds a plurality of substrates; a reaction container into which the holder is conveyed; a process-gas supplying mechanism that supplies a process gas into the reaction container; and a heating mechanism that heats the reaction container to conduct a film-forming process to the substrates when the process gas is supplied. Flow-rate-parameter table-data associating number-data of the substrates to be processed by one batch-process with target-data of flow-rate parameter of the process gas is stored in a flow-rate-parameter table-data storing part. A controlling unit obtains target-data of flow-rate parameter of the process gas, depending on an actual number of the substrates to be processed by one batch-process, based on the flow-rate-parameter table-data stored in the flow-rate-parameter table-data storing part, and controls the process-gas supplying mechanism according to the obtained target-data. The target-data of flow-rate parameter are determined in such a manner that a speed of the film-forming process is uniform among a plurality of batch-processes in which the numbers of substrates to be processed are different from each other. <IMAGE>
申请公布号 EP1557873(A1) 申请公布日期 2005.07.27
申请号 EP20030769959 申请日期 2003.10.29
申请人 TOKYO ELECTRON LIMITED 发明人 FUJITA, TAKEHIKO;OKADA, MITSUHIRO,;UMEZAWA, KOTA;HASEBE, KAZUHIDE;SAKAMOTO, KOICHI,
分类号 C23C16/46;H01L21/205;C23C16/52;F27B17/00;H01L21/00;(IPC1-7):H01L21/205 主分类号 C23C16/46
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