METHOD FOR DATA SAMPLING FOR UES IN SEMICONDUCTOR MEMORY DEVICE AND CIRCUITS THEREOF,申请号KR20040004208-传众专利搜索

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发明名称	METHOD FOR DATA SAMPLING FOR UES IN SEMICONDUCTOR MEMORY DEVICE AND CIRCUITS THEREOF
摘要
申请公布号	KR20050076285(A)	申请公布日期	2005.07.26
申请号	KR20040004208	申请日期	2004.01.20
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	YOON, YONG JIN;LEE, JONG CHEOL;CHO, UK RAE
分类号	G11C11/417;G11C7/10;G11C11/40;H04L7/00;(IPC1-7):G11C11/40	主分类号	G11C11/417
代理机构		代理人
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