发明名称 Double pinned photodiode for CMOS APS and method of formation
摘要 A pinned photodiode, which is a double pinned photodiode having increased electron capacitance, and a method for forming the same are disclosed. The invention provides a pinned photodiode structure comprising a substrate base over which is a first layer of semiconductor material. There is a base layer of a first conductivity type, wherein the base layer of a first conductivity type is the substrate base or is a doped layer over the substrate base. At least one doped region of a second conductivity type is below the surface of said first layer, and extends to form a first junction with the base layer. A doped surface layer of a first conductivity type is over the at least one region of a second conductivity type and forms a second junction with said at least one region of a second conductivity type.
申请公布号 US6921934(B2) 申请公布日期 2005.07.26
申请号 US20030400389 申请日期 2003.03.28
申请人 MICRON TECHNOLOGY, INC. 发明人 PATRICK INNA
分类号 H01L27/146;H01L31/0352;(IPC1-7):H01L31/062;H01L31/113 主分类号 H01L27/146
代理机构 代理人
主权项
地址