发明名称 Apparatus for and method of measuring jitter
摘要 A signal under measurement x(t) is transformed into a complex analytic signal z<SUB>c</SUB>(t), and an instantaneous phase of the x<SUB>c</SUB>(t) is estimated using the z<SUB>c</SUB>(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform Deltaphi(t) of the x(t), and the Deltaphi(t) is sampled at a timing close to a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T<SUB>0</SUB>/T<SUB>k,k+1 </SUB>of the fundamental period T<SUB>0 </SUB>of the x(t) and the sampling time interval T<SUB>k,k+1 </SUB>to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence.
申请公布号 US6922439(B2) 申请公布日期 2005.07.26
申请号 US20010811153 申请日期 2001.03.16
申请人 ADVANTEST CORPORATION 发明人 YAMAGUCHI TAKAHIRO;ISHIDA MASAHIRO;SOMA MANI
分类号 G01R29/02;G01R29/027;G01R29/26;H03K5/26;H04L1/20;(IPC1-7):H04B17/00 主分类号 G01R29/02
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