发明名称 Front side seal to prevent germanium outgassing
摘要 A method of manufacturing an integrated circuit having a gate structure above a substrate that includes germanium utilizes at least one layer as a seal. The layer advantageously can prevent back sputtering and outdiffusion. A transistor can be formed in the substrate by doping through the layer. Another layer can be provided below the first layer. Layers of silicon dioxide, silicon carbide, silicon nitride, titanium, titanium nitride, titanium/titanium nitride, tantalum nitride, and silicon carbide can be used.
申请公布号 US6921709(B1) 申请公布日期 2005.07.26
申请号 US20030620194 申请日期 2003.07.15
申请人 ADVANCED MICRO DEVICES, INC. 发明人 PATON ERIC N.;WANG HAIHONG;XIANG QI
分类号 H01L21/265;H01L21/336;H01L21/84;H01L29/10;(IPC1-7):H01L21/336 主分类号 H01L21/265
代理机构 代理人
主权项
地址