发明名称 Method for making a socket to perform testing on integrated circuits
摘要 A interconnect structure is inexpensively manufactured and easily insertable into a socket. The interconnect structure is manufactured by forming a sacrificial substrate with cavities that is covered by a masking material having openings corresponding to the cavities. A first plating process is performed by depositing conductive material, followed by coupling wires within the openings and performing another plating process by depositing more conductive material. The interconnect structure is completed by first removing the masking material and sacrificial substrate. Ends of the wires are coupled opposite now-formed contact structures to a board. To complete the socket, a support device is coupled to the board to hold a tested integrated circuit.
申请公布号 US6920689(B2) 申请公布日期 2005.07.26
申请号 US20020310791 申请日期 2002.12.06
申请人 FORMFACTOR, INC. 发明人 KHANDROS IGOR Y.;MATHIEU GAETAN L.;REYNOLDS CARL V.
分类号 G01R1/04;G01R1/073;G01R3/00;(IPC1-7):H01R43/02 主分类号 G01R1/04
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