发明名称 Test system for laser diode far-field pattern measurement
摘要 A test system for positioning and measuring the far-field pattern of a laser diode under test (LDUT) using a single objective lens and two relay lenses. Positioning is achieved by passing light from the LDUT through a video microscope formed by the objective lens and a first relay lens, which focuses the light onto an image plane for capture by a first camera. Far-field pattern measurement is performed by reflecting a portion of the focused light through a second relay lens, which collimates the light and directs the unfocused light onto an infinity image plane, where it is captured by a second video camera. Angular orientation is achieved using a laser collimator that reflects beam energy from a datum plane of the LDUT. The reflected beam energy forms a point image at the infinity image plane that is used to determine and/or adjust the angular orientation of the LDUT.
申请公布号 US6922232(B2) 申请公布日期 2005.07.26
申请号 US20020254344 申请日期 2002.09.24
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 FARNSWORTH STEPHEN W.
分类号 G01J1/42;(IPC1-7):G01J1/00 主分类号 G01J1/42
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