发明名称 MULTIPLE-WAVELENGTH BATCH MONITORING METHOD AND DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a multiple-wavelength batch monitoring method and device which can be located on a transmission line, and be used in place of functions of an optic spectrum analyzer by combining cheap optical parts. <P>SOLUTION: The device uses a tunable filter 9, which is used in micromachines or planar lightwave circuit (PLC) and has advantages in costs and productivity, and has a calibrated standard light source 10 inside for compensation of temperature drift of such devices. Therefore, the device can be provided on a transmission line, and be used in place of functions of an optic spectrum analyzer by combining cheap optical parts. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005195474(A) 申请公布日期 2005.07.21
申请号 JP20040002448 申请日期 2004.01.07
申请人 NEC CORP 发明人 OGUMA TAKESHI
分类号 G01J3/26;G01J3/02;G01J3/45;G01J9/02;H04B10/07;H04B10/079;H04J14/00;H04J14/02 主分类号 G01J3/26
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