发明名称 |
Wet bench wafer floating detection system |
摘要 |
A method and system for preventing wafer breakage during wet processing is desscribed. A wet processing tank is provided wherein a wafer is to be placed within the wet processing tank. A sensor is provided within the wet processing tank wherein the sensor continuously counts bubbles formed within the wet processing tank in a time interval. The sensor is queried wherein if a bubble count within the time interval exceeds a trigger point, then an alarm is given so that a process lot will not be entered into the wet processing tank.
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申请公布号 |
US2005158885(A1) |
申请公布日期 |
2005.07.21 |
申请号 |
US20040761002 |
申请日期 |
2004.01.20 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO. |
发明人 |
TSENG WEN-SONG;LU KUO-LIANG |
分类号 |
H01L21/00;(IPC1-7):C25F1/00;C25F3/30;C25F5/00;B08B6/00;H01L21/66;G01R31/26 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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