发明名称 Wet bench wafer floating detection system
摘要 A method and system for preventing wafer breakage during wet processing is desscribed. A wet processing tank is provided wherein a wafer is to be placed within the wet processing tank. A sensor is provided within the wet processing tank wherein the sensor continuously counts bubbles formed within the wet processing tank in a time interval. The sensor is queried wherein if a bubble count within the time interval exceeds a trigger point, then an alarm is given so that a process lot will not be entered into the wet processing tank.
申请公布号 US2005158885(A1) 申请公布日期 2005.07.21
申请号 US20040761002 申请日期 2004.01.20
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO. 发明人 TSENG WEN-SONG;LU KUO-LIANG
分类号 H01L21/00;(IPC1-7):C25F1/00;C25F3/30;C25F5/00;B08B6/00;H01L21/66;G01R31/26 主分类号 H01L21/00
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