发明名称 Substrate identification circuit and semiconductor device
摘要 Provided is a substrate identification circuit that generates a numeric value, whose duplication is difficult and which is proper to a substrate, at low cost and a semiconductor device having such a substrate identification circuit. A substrate identification circuit 304 is produced by utilizing variations in characteristics among TFTs formed on a substrate having an insulating surface. The substrate identification circuit 304 includes a plurality of proper bit generating circuits, each of which is constructed from a plurality of TFTs and outputs a one-bit random number based on variations in characteristics among the plurality of TFTs. The substrate identification circuit generates a numeric value proper to the substrate using the one-bit random number. The substrate identification circuit may include a circuit that makes a judgment by comparing the numeric value proper to the substrate with an identification number inputted from the outside.
申请公布号 US2005156819(A1) 申请公布日期 2005.07.21
申请号 US20050054953 申请日期 2005.02.11
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KATO KIYOSHI;YAMAZAKI SHUNPEI
分类号 G02F1/1368;G09F9/00;G09F9/30;G09F9/35;H01L21/02;H01L21/77;H01L21/84;H01L23/544;H01L27/12;H01L29/786;(IPC1-7):G09G3/20 主分类号 G02F1/1368
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