发明名称 |
Substrate identification circuit and semiconductor device |
摘要 |
Provided is a substrate identification circuit that generates a numeric value, whose duplication is difficult and which is proper to a substrate, at low cost and a semiconductor device having such a substrate identification circuit. A substrate identification circuit 304 is produced by utilizing variations in characteristics among TFTs formed on a substrate having an insulating surface. The substrate identification circuit 304 includes a plurality of proper bit generating circuits, each of which is constructed from a plurality of TFTs and outputs a one-bit random number based on variations in characteristics among the plurality of TFTs. The substrate identification circuit generates a numeric value proper to the substrate using the one-bit random number. The substrate identification circuit may include a circuit that makes a judgment by comparing the numeric value proper to the substrate with an identification number inputted from the outside.
|
申请公布号 |
US2005156819(A1) |
申请公布日期 |
2005.07.21 |
申请号 |
US20050054953 |
申请日期 |
2005.02.11 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
KATO KIYOSHI;YAMAZAKI SHUNPEI |
分类号 |
G02F1/1368;G09F9/00;G09F9/30;G09F9/35;H01L21/02;H01L21/77;H01L21/84;H01L23/544;H01L27/12;H01L29/786;(IPC1-7):G09G3/20 |
主分类号 |
G02F1/1368 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|