发明名称 METHOD AND APPARATUS FOR PLASMA PROCESSING
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma processing method capable of enhancing the accuracy of prediction or the like of a processing result by a plasma processing apparatus, and relieving a load required for production of a model. <P>SOLUTION: A measured data storage 202 stores measured data Xa, Xb under referenced operating conditions A, B, an analysis processing result storage 210 stores models Ka, Kb generated by the multivariate analysis; the measured data storage 202 stores measured data Xp under a new operating condition P; and an analysis processing section 208 respectively multiplies weight coefficients Wa, Wb with the measured data Xa and Xb and adds the measured data Xp to the products to obtain weighted measured data and the weight coefficients Wa, Wb, respectively multiplies the weight coefficients Wa, Wb with the models Ka, Kb, and sums the products to obtain a model Kp on the basis of the new operating condition P. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005197503(A) 申请公布日期 2005.07.21
申请号 JP20040002883 申请日期 2004.01.08
申请人 TOKYO ELECTRON LTD 发明人 TOMOYASU MASAYUKI
分类号 H05H1/00;C23C16/50;C23F4/00;H01J37/32;H01L21/00;H01L21/205;H01L21/3065;H01L21/66;H05H1/46 主分类号 H05H1/00
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