发明名称 Non-volatile memory cell comprising a dielectric layer and a phase change material in series
摘要 The invention provides for a nonvolatile memory cell comprising a dielectric material in series with a phase change material, such as a chalcogenide. Phase change is achieved in chalcogenide memories by thermal means. Concentrating thermal energy in a relatively small volume assists this phase change. By applying high voltage across a dielectric layer, dielectric breakdown occurs, forming a low-resistance rupture region traversing the dielectric layer. This rupture region can serve to concentrate thermal energy in a phase-change memory cell. In a preferred embodiment, such a cell can be used in a monolithic three dimensional memory array.
申请公布号 US2005158950(A1) 申请公布日期 2005.07.21
申请号 US20050040255 申请日期 2005.01.19
申请人 MATRIX SEMICONDUCTOR, INC. 发明人 SCHEUERLEIN ROY E.;HERNER S. B.
分类号 G11C7/00;G11C11/39;G11C17/16;H01L21/336;H01L21/82;H01L27/24;H01L29/73;H01L45/00;(IPC1-7):H01L21/336 主分类号 G11C7/00
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