发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To appropriately control the trench formation process in a semiconductor manufacturing method. SOLUTION: The laminated film of a pad oxide film 12 and a silicon nitride film 13 is deposited on a silicon substrate 11, and a polysilicon film 14 is formed on the laminated film. The polysilicon film 14, the silicon nitride film 13, and the pad oxide film 12 are successively etched through a resist mask 15. The silicon substrate 11 is then etched for the formation of a trench 16 with the polysilicon film 14 serving as the mask. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005197474(A) 申请公布日期 2005.07.21
申请号 JP20040002407 申请日期 2004.01.07
申请人 OKI ELECTRIC IND CO LTD;MIYAGI OKI ELECTRIC CO LTD 发明人 SHIMIZU NORIMITSU;KOIKE OSAMU
分类号 H01L21/3065;H01L21/308;H01L21/311;H01L21/76;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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