发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To appropriately control the trench formation process in a semiconductor manufacturing method. SOLUTION: The laminated film of a pad oxide film 12 and a silicon nitride film 13 is deposited on a silicon substrate 11, and a polysilicon film 14 is formed on the laminated film. The polysilicon film 14, the silicon nitride film 13, and the pad oxide film 12 are successively etched through a resist mask 15. The silicon substrate 11 is then etched for the formation of a trench 16 with the polysilicon film 14 serving as the mask. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005197474(A) |
申请公布日期 |
2005.07.21 |
申请号 |
JP20040002407 |
申请日期 |
2004.01.07 |
申请人 |
OKI ELECTRIC IND CO LTD;MIYAGI OKI ELECTRIC CO LTD |
发明人 |
SHIMIZU NORIMITSU;KOIKE OSAMU |
分类号 |
H01L21/3065;H01L21/308;H01L21/311;H01L21/76;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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