发明名称 DEVELOPING METHOD IN PROCESS OF MANUFACTURING SEMICONDUCTOR DEVICE AND DEVELOPING DEVICE EXECUTING THIS
摘要 PROBLEM TO BE SOLVED: To provide a developing device and developing method, wherein in a cleaning and drying process after the photoresist on a semiconductor substrate is developed, no defects occur in a photoresist pattern. SOLUTION: After the photoresist on the semiconductor substrate is developed, the semiconductor substrate is rotated at rotation speeds of two stages consisting of a low speed and a middle speed to execute a cleaning process, and the semiconductor substrate is rotated at the rotation speed which is extremely lower than a low speed rotation, so that a paddle of pure water on the semiconductor substrate is formed. Thereafter, the semiconductor substrate is rotated at a higher speed than the middle speed rotation, to execute a drying process. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005197455(A) 申请公布日期 2005.07.21
申请号 JP20040002113 申请日期 2004.01.07
申请人 NEC ELECTRONICS CORP 发明人 MORI HIROYUKI
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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