发明名称 Delay measurement system
摘要 In a system performing a delay measurement between a master device and a slave device, a master device transmits a delay measuring signal at a fixed timing relative to a synchronous pattern signal in an overhead and transmits a frame signal in which an internal delay time, associated with a frame signal generation, from a delay measurement start timing to a transmission timing of the delay measuring signal is stored in the delay measuring signal as a master offset value; and a slave device adds an internal delay time of its own device associated with a frame signal generation to the master offset value after having received the frame signal to make a slave offset value and transmits a frame signal in which the delay measuring signal is updated with the slave offset value; the master device calculates a delay time between both devices by subtracting the slave offset value from a time difference between a timing at which the delay measuring signal within the frame signal transmitted from the slave device is received and the delay measurement start timing.
申请公布号 US2005159914(A1) 申请公布日期 2005.07.21
申请号 US20040848468 申请日期 2004.05.18
申请人 SUNDEN HIRONOBU;HAMADA MITSUNORI 发明人 SUNDEN HIRONOBU;HAMADA MITSUNORI
分类号 G06F19/00;H04B7/26;H04J3/06;H04J3/16;H04W24/00;H04W56/00;H04W92/00;(IPC1-7):G06F19/00 主分类号 G06F19/00
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