| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an embedded MCU which can be tested at high speed with a memory emulation module, and a test method therefor. <P>SOLUTION: The embedded MCU 400 comprises an internal memory block 440, connected with a bus master 420, for storing temporary data of the bus master 420 or storing a test vector when in a test mode; a memory controller 430 for accessing an operative external memory 460 for a processor core 410 or the internal memory block 440; and a memory emulation module block 450, connected between the memory controller 430 and the memory block 440, for storing the test vector in the memory block 440 when in the test mode. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
