发明名称 High photosensitivity CMOS image sensor pixel architecture
摘要 The photosensitive volume of a pixel is extended beyond the photodiode region, which allows the pixel sensitivity to be relatively independent of the photodiode region. In an example embodiment, the photosensitive volume can be maximized by using a CMOS process to remove heavily doped material (e.g., as from in a P well) from the photodiode and to form a pn junction on lightly doped material (e.g., p-type epitaxial layer). The photosensitive volume is thus defined by the larger area of the lightly doped material rather than being merely restricted to the photodiode region. Based on the requirements of signal-to-noise ratios (SNR) and desired dynamic range (DR), a minimized size photodiode (with optimized area and perimeter) can be designed to maximize photo conversion gain, which maximizes sensitivity.
申请公布号 US2005156206(A1) 申请公布日期 2005.07.21
申请号 US20040759899 申请日期 2004.01.16
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 QIANG LUO;CHRISTINA PHAN;WILLEM KINDT J.
分类号 H01L27/146;H01L31/103;(IPC1-7):H01L29/76;H01L21/823 主分类号 H01L27/146
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