Jig device for transporting and testing integrated circuit chip

摘要

A novel jig device useful for transporting and testing an IC chip is disclosed. The jig device comprises a main jig body, having a holding part onto which the IC chip to be tested is attracted and held and at least one suction path is formed, and at least one contact probe arranged in the suction path of the main jig body. The main jig body comprises preferably a base part and front head part. The contact probe connects electronically between a terminal of said the IC chip held at the holding part and an electrode of circuit board of tester.